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Reflection High-Energy Electron Diffraction
Ichimiya, Ayahiko (Nagoya University, Japan)
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Reflection High-Energy Electron Diffraction
Ichimiya, Ayahiko (Nagoya University, Japan)
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.
366 pages, black & white illustrations
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 17 de febrero de 2011 |
| ISBN13 | 9780521184021 |
| Editores | Cambridge University Press |
| Páginas | 366 |
| Dimensiones | 171 × 245 × 20 mm · 636 g |
| Lengua | English |