Thin Film Materials: Stress, Defect Formation and Surface Evolution - Freund, L. B. (Brown University, Rhode Island) - Libros - Cambridge University Press - 9780521529778 - 11 de diciembre de 2008
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Thin Film Materials: Stress, Defect Formation and Surface Evolution

Freund, L. B. (Brown University, Rhode Island)

Thin Film Materials: Stress, Defect Formation and Surface Evolution

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. Describing fundamental concepts with practical case studies, highly illustrated, thorough referencing and containing numerous homework problems, this book will be essential for graduate courses on thin films and the classic reference for researchers.


770 pages, 75 b/w illus. 75 exercises

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 11 de diciembre de 2008
ISBN13 9780521529778
Editores Cambridge University Press
Páginas 770
Dimensiones 175 × 247 × 35 mm   ·   1,38 kg
Lengua English  

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Mas por Freund, L. B. (Brown University, Rhode Island)