Applied Scanning Probe Methods: Characterization - Nanoscience and Technology - Bharat Bhushan - Libros - Springer-Verlag Berlin and Heidelberg Gm - 9783642072123 - 25 de noviembre de 2010
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Applied Scanning Probe Methods: Characterization - Nanoscience and Technology 1st Ed. Softcover of Orig. Ed. 2007 edition

Bharat Bhushan

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Applied Scanning Probe Methods: Characterization - Nanoscience and Technology 1st Ed. Softcover of Orig. Ed. 2007 edition

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.


383 pages, 7 black & white tables, biography

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 25 de noviembre de 2010
ISBN13 9783642072123
Editores Springer-Verlag Berlin and Heidelberg Gm
Páginas 383
Dimensiones 156 × 234 × 20 mm   ·   539 g
Editor Bhushan, Bharat
Editor Kawata, Satoshi

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Mas por Bharat Bhushan