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Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution
Tsong, Tien T. (Pennsylvania State University)
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Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution
Tsong, Tien T. (Pennsylvania State University)
Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.
400 pages, black & white illustrations
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 15 de septiembre de 2005 |
| ISBN13 | 9780521019934 |
| Editores | Cambridge University Press |
| Páginas | 400 |
| Dimensiones | 157 × 234 × 22 mm · 556 g |
| Lengua | English |