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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Wang, Zhong Lin (Georgia Institute of Technology)
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Wang, Zhong Lin (Georgia Institute of Technology)
Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.
456 pages, 224 b/w illus. 10 tables
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 23 de mayo de 1996 |
| ISBN13 | 9780521482660 |
| Editores | Cambridge University Press |
| Páginas | 458 |
| Dimensiones | 170 × 244 × 25 mm · 1,10 kg |