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High Quality Test Pattern Generation and Boolean Satisfiability Stephan Eggersgluss 2012 edition
High Quality Test Pattern Generation and Boolean Satisfiability
Stephan Eggersgluss
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
193 pages, 52 black & white tables, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 31 de enero de 2012 |
| Fecha de lanzamiento original | 2011 |
| ISBN13 | 9781441999757 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 193 |
| Dimensiones | 155 × 235 × 12 mm · 476 g |
| Lengua | Inglés |