Recomienda este artículo a tus amigos:
Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier R 1st ed. 2018 edition
Cheng
Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier R 1st ed. 2018 edition
Cheng
This thesis addresses selected unsolved problems in the chemical mechanical polishing process (CMP) for integrated circuits using ruthenium (Ru) as a novel barrier layer material.
137 pages, 103 Illustrations, black and white; XVIII, 137 p. 103 illus.
Medios de comunicación | Libros Book |
Publicado | 18 de septiembre de 2017 |
ISBN13 | 9789811061646 |
Editores | Springer Verlag, Singapore |
Páginas | 137 |
Dimensiones | 399 g |