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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
Adam Foster
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
282 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 23 de noviembre de 2010 |
| ISBN13 | 9781441923066 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 282 |
| Dimensiones | 155 × 235 × 16 mm · 417 g |
| Lengua | Inglés |
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